Inspection of bulk material with allPIXA wave and prism camera

Friday, 11. January 2019

The aim of this work is to compare the trilinear line-scan camera allPIXA wave with a prism based camera with respect to bulk material inspection. Traditionally, prism-based cameras are often selected over trilinear cameras when it comes to bulk material scanning, as the inherent line-shift of a trilinear camera can only be corrected for when the object scan velocity is known. We demonstrate that this traditional approach is not always necessary if the right trilinear sensor is selected and operated in binning mode to average multiple pixels.