Multi-Channel Flash Feature
The allPIXA pro, allPIXA wave and allPIXA evo camera can be used to trigger up to four different flash controller channels synchronized to its line acquisition. This can be used to acquire several images with different illumination geometries and/or colors (white, red, green, UV, IR) simultaneously in only one scan by line-multiplexing.
Analyzing textures in fiber technology
Online testing of fibers can be a challenge for measurement technology providers. Together with industrial partners, the staff of the Fraunhofer IGCV has succeeded in reliably detecting fiber defects in production. Within the current project AirCarbon III, the Fraunhofer IGCV conducts research with AI in fiber technology.
Technical Note - Semiconductor wafer inspection using allPIXA wave
Capturing yield limiting defects is crucial for semiconductor wafer devices yield. Here we describe how semiconductor wafer manufacturing can take advantage of its ultra-high resolution 15,360 pixels and rich features to advantage of in-line inspection systems allPIXA wave Trilinear color and mono TDI line scan camera.
Whitepaper - Synchronizing modes of allPIXA classic, pro and wave
The white paper gives a general overview as well as to function as a reference for all tasks related to synchronizing allPIXA classic, allPIXA pro and allPIXA wave cameras.
Connector pin inspection
This report is an example how to use a 3DPixa and the 3DAPI to implement a measuring task for connectors.
A statement by Peter Tix about measures taken by Chromasens to secure deliveries during the COVID-19 crisis.
New White Paper
This white paper gives a comprehensive overview on the limitations of the block-matching approach in height reconstruction for passive stereoscopy. It describes a variety of different artefacts that appear at certain image features.